An attempt to model ion conductance when a SICM approaches a flat surface
نویسنده
چکیده
Scanning Ion Conductance Microscopy, it’s development, design and use are introduced. The theory behind modelling ion current flow into the SICM probe tip and the problems involved with analytically modelling the current flow are then briefly discussed. A numerical simulation using the Finite Difference Method is then used to model the current flow as the microscope probe tip approaches a flat non conducting surface.
منابع مشابه
Scanning ion conductance microscopy: a nanotechnology for biological studies in live cells
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